Bob Neves was founder and Chairman/CTO of Microtek Laboratories, an Independent Test Facility with offices in Jiangsu China and California USA. He served as President of IRTS, manufacturer of the original HATS tester. Bob has served as Chairman of the Board for the IPC, the Association Connecting Electronics Industries. He was inducted into the IPC Hall of Fame, the IPC's highest lifetime honor. He has earned the IPC Presidents award and Dieter Bergman IPC Fellow award in recognition of his long term service to the Electronics Industry. Bob has served as the IPC's TAEC Chairman, Rigid Board General Committee chairman, HDI General Committee chairman, Rigid Board Test Method Task Group chairman, Laboratory Qualifications (IPC-QL-653) Committee chairman and participated on more than 50 IPC Technical Committees over this career. He served as Chair of IEC TC91 Working Group 10 Printed Wiring Test Methods and was a member of IEC T91 Working Groups for Printed Circuit Boards & Copper Clad Laminates. He served as Chairman of California Circuit Board Association. Bob has published dozens of articles and technical papers about Reliability, Testing, Test Methods and Failure Analysis and is the author of the PCB Acceptability section in Coombs “Printed Circuit Handbook” Sixth Edition. Bob has taught many classes on the fundamentals of Testing, Reliability and Failure Analysis of Electronic Systems.

Sarah Liu previously served as the Assistant to the Chairman and Chief Technical Officer of Microtek Changzhou Laboratories, a leading independent testing laboratory in Jiangsu China, where she has made great contributions.
Ms. Liu has a MA in Foreign Linguistics and Applied Linguistics and was once the recipient of National Scholarship for Graduate Student. Proficient in Chinese, English and Japanese, she is a certified Chinese/ English translator and consecutive interpreter (CATTI Level II) by the Ministry of Human Resources and Social Security of China. She also bears other certificates like JLPT (Level N2).
For years working as the Assistant to the Chief Technical Officer and an important administrative staff member of Microtek, she has acquired extensive knowledge in PCB testing and its up-and-down-stream chains. In addition, with her translation skills and technical knowledge, she has translated numerous technical documents, academic papers, published essays and manuals, and provided interpretation for hundreds of closed-door and public technical conferences, training sessions, seminars and interviews. She has also gained much experience in foreign-related administrative matters, industrial exhibitions, and overseas procurements.
Ms. Liu is currently the Office Manager of Reliability Assessment Solutions, responsible for administrative management, PR and trade coordination.